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103.4 - Semiconductor Thin Film for the Composition of Thin Films
Standard Reference Material SRMs 2841 and 2842 are intended for use as a reference standard for analytical methods that measure the composition of thin films, such as electron microprobe analysis (EMPA), photoluminesence (PL), auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). The SRM consists of an epitaxial layer of ALxGa1-xAs, 3µm thick, on a 1 cm x 1 cm square of GaAs substrate. The semiconductor chip is attached with carbon tape to a 2.5 cm diameter stainless steel disk for labeling and handling.
For further information see SP 260-163
PLEASE NOTE: The tables are presented to facilitate comparisons among a family of materials to help customers select the best SRM for their needs. For specific values and uncertainties, the certificate is the only official source.
- Certified values are normal font
- Reference values are italicized
- Values in parentheses are for information only
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| 2841 | 2842 | |
|---|---|---|
| Status >> | Now Selling | Now Selling |
| Description >> | Semiconductor Thin Film: AlxGa1-xAs Epitaxial Layers (Al mole fraction x near 0.20) |
Semiconductor Thin Film: AlxGa1-xAs Epitaxial Layers (Al mole fraction x near 0.30) |
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| Unit of Issue >> | disk | disk |
| Al ( x in Alx Ga1-x As) | 0.20 | 0.30 |