Search for Materials

209.1 - Diffraction and Scattering

SRMs 656, 676a, 674b, 1878b and 1879b consist of high phase purity materials for use in the quantitative analysis of samples by the internal standard method. SRM 656 consists of a combination of the α and β polymorphs; one is high in the α phase content (α 656), while the other contains a larger amount of the β polymorph (β 656). SRMs 640e, 660c, 675, and 1976b consist of materials with select crystallographic and microstructure properties used in the evaluation of diffraction equipment for the following variables; 1) d-spacing or line position, 2) line or instrument intensity, and 3) instrumental or sample contributions to the shape of reflection profiles. SRM 1976b, a sintered alumina plate, is also certified with respect to lattice parameters as well as 13 relative intensity values from 22° to 155° 2q (Cu Ka ). SRM 1990 is certified for lattice parameter. 

PLEASE NOTE: The tables are presented to facilitate comparisons among a family of materials to help customers select the best SRM for their needs. For specific values and uncertainties, the certificate is the only official source.


- Certified values are normal font
- Reference values are italicized
- Values in parentheses are for information only


Detail - Detail    Certificate - Certificate    Report of Investigation - Report of Investigation    MSDS - MSDS    Data Files - Data Files    Questionaire - Questionnaire


 
 
  SRM Description Unit Size     Application

Detail Certificate MSDS 640f
Now Selling
Line Position and Line Shape Standard for Powder Diffraction (Silicon Powder) 7.5 g  
Line Position
Line Shape
Detail Certificate MSDS 656
Now Selling
Silicon Nitride Powders (Quantitative Analysis Powder Diffraction Standard)
2 x 10 g   Quantitative Analysis
Detail Certificate MSDS 660c
Now Selling
Line Position and Line Shape Standard for Powder Diffraction (Lanthanum Hexaboride Powder)
6 g  
Line Position
Line Shape
Detail Certificate MSDS 674b
Out of Stock
X-Ray Powder Diffraction Intensity Set (Quantitative Powder Diffraction Standard) 10.00 g (powder)   Quantitative Analysis
Detail Certificate MSDS 675
Now Selling
Line Position, Mica (XRD) 7.5 g   Line Position - Low 2θ
Detail Certificate MSDS 676a
Out of Stock
Alumina Powder (Quantitative Analysis Powder Diffraction Standard) 20 g   Quantitative Analysis
Detail Certificate MSDS 1878b
Now Selling
Respirable Alpha Quartz (Quantitative X-Ray Powder Diffraction Standard) 5 g   Quantitative Analysis
Detail Certificate MSDS 1879b
Now Selling
Respirable Cristobalite (Quantitative X-Ray Powder Diffraction Standard) 5 g   Quantative Analysis
Detail Certificate MSDS 1976c
Now Selling
Instrument Response Standard for X-Ray Powder Diffraction 1 disc   Line Position, Intensity, 2θ
Detail Certificate MSDS 1979
Now Selling
Powder Diffraction Line Profile Standard for Crystallite Size Analysis(Nano-Crystalline ZnO Powder)
2 x 3 g   Line shape
Crystalline size
Detail Certificate MSDS 1990
Now Selling
Single Crystal Diffractometer Alignment Standard - Ruby Sphere
3 spheres   Quantitative Analysis
Detail Certificate MSDS 2000
Now Selling
Calibration Standard for High-Resolution X-Ray Diffraction 1 block   Line Position
Detail Certificate MSDS Data Files 3600
Now Selling
Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering coupon   Small-angle scattering intensity