Material Details

SRM 2000 - Calibration Standard for High-Resolution X-Ray Diffraction

High-resolution X-ray diffraction, HRXRD, XRD, SiGe, silicon germanium, epitaxy, epilayer,single-crystal, Si, silicon, lattice spacing, d spacing, thin film


Certificate - Certificate    MSDS - MSDS    Detail - Table


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Details
Description: Calibration Standard for High-Resolution X-Ray Diffraction
Lot: N/A
Expiration Date:  
Unit Price * : $1,777.00
Unit of Issue: 1 block
Status: Now Selling
Certificate Date: 3/5/2012
Certificate Revision Date: 05 March 2012 (Corrected uncertainty in Table 1 for dSRM; editorial changes).
MSDS Date: 3/31/2012
Technical Contact: James Cline Email
Don Windover Email
Additional Information: N/A
Shipping Information
Perishable: No
Hazardous Material: No
Material Hazard Class: N/A
Measurand Data
- Certified values are normal font
- Reference values are italicized
- Values in parentheses are for information only

The certificate is the only official source for values and uncertainties.
Table 209.1 - X-Ray Diffraction (powder and solid forms)   Additional Information >>
  Parameter Value
  XRD Application
Line Position
Line Position

* Prices are subject to change without notice


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Date created: 3/10/2002

Last updated: 1/29/2015